Search Data.gov

• Organization: National Institute of Standards and Technology
• Updated: 2020-06-01 00:00:00 | Harvested: June 27, 2025 at 07:23 PM

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and...

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• Organization: National Institute of Standards and Technology
• Updated: 2020-10-29 00:00:00 | Harvested: June 27, 2025 at 07:27 PM

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a...

• zip file of iucr crystallographic information file (cif) datasets
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