Diffraction Data for SRM 660c

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Metadata Last Checked: June 27, 2025 | Last Modified: 2020-10-29 00:00:00

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using scintillator point detector with a graphite analyzer, and is stored in CIF format.

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Xray Powder Diffraction; Diverging Beam Diffractometer; Powder Diffraction SRM

Complete Metadata

bureauCode	[ "006:55" ]
identifier	ark:/88434/mds2-2315
issued	2022-03-16
language	[ "en" ]
programCode	[ "006:045" ]
references	[ "https://doi.org/10.1017/S0885715620000068" ]
theme	[ "Materials:Materials characterization" ]