Diffraction Data for SRM 640f

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Metadata Last Checked: June 27, 2025 | Last Modified: 2020-06-01 00:00:00

The data from this instrument consists of sets of measurements of Xray intensity as a function of diffraction angle. Almost all of it is collected using a position-sensitive detector (PSD), and is stored in CIF format.

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Xray Powder Diffraction; Diverging Beam Diffractometer; Powder Diffraction SRM

Complete Metadata

bureauCode	[ "006:55" ]
identifier	ark:/88434/mds2-2251
issued	2020-06-22
landingPage	https://data.nist.gov/od/id/mds2-2251
language	[ "en" ]
programCode	[ "006:045" ]
theme	[ "Materials:Materials characterization" ]