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Found 8 dataset(s) matching "Semiconductor metrology".
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Video tutorials from NIST workshop on X-ray metrology for the semiconductor industry
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This data set consists of both measured and simulated optical intensities scattered off periodic line arrays, with simulations based upon an average geometric model for these lines. These data...
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Test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz - Calnet
The data are measurements of test scattering parameter calibration data for on-wafer measurements from 10 MHz to 110 GHz. Data includes S-parameter data (Ref_Cs_g25_HF_0.s2p, Ref_Rs_g25_HF_0.s2p,...
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The chemical gel point of thermoset composites is crucial to the design of manufacturing parameters in processes and industries that utilize these materials, like additive manufacturing and...
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Included here are figures and other relevant data from the paper "Distributed contactless interconnects for millimeter-wave heterogeneous integration", submitted to TMTT Letters. Abstract:...
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The processed spectroscopic and experimental conditions (as applicable) data which are used to construct each figure is provided.
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An in-house developed finite-difference time-domain (FDTD) code has been used to simulate certain patterned defects as found in the semiconductor industry. Intrinsic to FDTD is the establishment...
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Included here are data used to generate figures from the paper "Digital control of a superconducting qubit using a Josephson pulse generator at 3 K".Abstract: Scaling of quantum computers to...
