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• Organization: National Institute of Standards and Technology
• Updated: 2022-04-07 00:00:00 | Harvested: June 27, 2025 at 07:43 PM

The EDS spectra discussed and used to create figures in the MRS journal article "Simulating Electron-Excited Energy Dispersive X-Ray Spectra with the NIST DTSA-II Open-Source Software Platform"

• iso/dis 22029 - iso/emsa spectrum file format embedded in a pkzip file
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• Organization: National Institute of Standards and Technology
• Updated: 2022-12-06 00:00:00 | Harvested: June 27, 2025 at 07:51 PM

EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with...

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• Organization: National Institute of Standards and Technology
• Updated: 2023-04-04 00:00:00 | Harvested: June 27, 2025 at 07:55 PM

Spectra measured from SRM-2063a and standards at 20 keV, 25 keV and 30 keV. Scripts for processing this data. Scripts for Monte Carlo simulating thin films of ADM-6005a and Al2O3 on CaF2 and for...

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