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X-ray Metrology for the Semiconductor Industry Tutorial Views: 0
- Organization: National Institute of Standards and Technology
- Updated: 2018-12-01 | Harvested: June 27, 2025 at 07:12 PM
Video tutorials from NIST workshop on X-ray metrology for the semiconductor industry
ZENO: Software for calculating hydrodynamic, electrical, and shape properties of polymer and particle suspensions Views: 0
- Organization: National Institute of Standards and Technology
- Updated: 2016-10-25 | Harvested: June 27, 2025 at 06:59 PM
ZENO is a software tool, which computes material, solution and suspension properties for a specified particle shape or molecular structure using path-integral and Monte Carlo methods. These properties include: capacitance, electric polarizability tensor, intrinsic conductivity, volume, gyration…