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• Organization: National Institute of Standards and Technology
• Updated: 2018-12-01 | Harvested: June 27, 2025 at 07:12 PM

Video tutorials from NIST workshop on X-ray metrology for the semiconductor industry

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• Organization: National Institute of Standards and Technology
• Updated: 2020-10-05 00:00:00 | Harvested: June 27, 2025 at 07:27 PM

Reduced small-angle x-ray and neutron scattering data in ASCII format and model structures for the Novavax, Inc. Respiratory Syncytial Virus (RSV) Fusion Glycoprotein Nanoparticle Vaccine in...

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• Organization: National Institute of Standards and Technology
• Updated: 2022-07-18 00:00:00 | Harvested: June 27, 2025 at 07:44 PM

The following data files include microstructure measurement results associated with the 2022 Additive Manufacturing Benchmark test series (AM-Bench 2022) AMB2022-01 benchmark on laser powder bed...

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• Organization: National Institute of Standards and Technology
• Updated: 2024-08-27 00:00:00 | Harvested: June 27, 2025 at 08:06 PM

This dataset consists of characterization of telechelic functional polyethylene oligomers, precursors, and resultant step-growth polyethylene with urethane-linkages between segments of different...