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Found 284 dataset(s) matching "microscopy".
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This folder contains descriptions and analytical data (i.e., electron microprobe, X-ray diffraction, spectral reflectance, and scanning electron microprobe analyses) for unexpanded and expanded...
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EDS spectra measured at E0 = 5 keV for 75 materials are provided along with the standards used for quantification with the NIST DTSA-II software for electron-excited X-ray microanalysis with...
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Splits of the less than 38 micron size fraction were processed to make oriented clay mounts and analyzed using X-ray diffraction (XRD) as part of a study examining the occurrence of chromium and...
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Sample Analyses: Unpolished bulk centimeter-scale sinter sub-samples were affixed to aluminum stubs using amorphous carbon paste and coated with 10 nm Au-Pd. Samples were analyzed at the USGS in...
