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On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures
This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI: 10.1109/JMW.2022.3232076Manuscript ID: JMW-2022-0108Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK TemperaturesPublished by: Institute of Electrical and Electronics Engineers (IEEE)
Complete Metadata
| bureauCode |
[ "006:55" ] |
|---|---|
| identifier | ark:/88434/mds2-2824 |
| issued | 2023-04-07 |
| landingPage | https://data.nist.gov/od/id/mds2-2824 |
| language |
[ "en" ] |
| programCode |
[ "006:045" ] |
| references |
[ "https://dx.doi.org/10.1109/JMW.2022.3232076" ] |
| theme |
[ "Electronics:Electromagnetics", "Electronics:Superconducting electronics" ] |
