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NIST FLYCHK Modelling Database - SRD 160

Published by National Institute of Standards and Technology | National Institute of Standards and Technology | Metadata Last Checked: July 14, 2025 | Last Modified: 2013-01-01 00:00:00
FLYCHK provides a capability to generate atomic level populations and charge state distributions for low-Z to mid-Z elements under NLTE conditions.

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