IGBT accelerated aging data set.

Published by Dashlink | National Aeronautics and Space Administration | Metadata Last Checked: September 06, 2025 | Last Modified: 2025-07-17

Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and in some cases, high-speed measurements of gate voltage, collector-emitter voltage and collector current are available. The data set is provided by the Prognostics CoE at NASA Ames.

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Complete Metadata

bureauCode	[ "026:00" ]
identifier	DASHLINK_134
issued	2010-09-13
landingPage	https://c3.nasa.gov/dashlink/resources/134/
programCode	[ "026:029" ]