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Found 2 dataset(s) matching "Auger parameter".

NIST X-ray Photoelectron Spectroscopy Database - SRD 20
- Organization: National Institute of Standards and Technology
- Updated: 2012-10-10 00:00:00 | Harvested: June 27, 2025 at 06:49 PM
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding...
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NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) - SRD 100
- Organization: National Institute of Standards and Technology
- Updated: 2014-11-01 00:00:00 | Harvested: June 27, 2025 at 06:49 PM
The NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) can be used to simulate Auger-electron spectra and X-ray photoelectron spectra of nanostructures such as...
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